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XRF Metrology

  • XRF Metrology
  • XRF Metrology
XRF MetrologyXRF Metrology

XRF Metrology


  • Offers an array of choices for X-ray optics and primary filters
  • Equipped with latest generation of Silicon Drift Detectors
  • Provides empirical and fundamental parameters (FP) solutions in a simple to set up calibration process
  • Large analysis chamber
  • X-Y-Z programmable positioning


Specialized application areas:


  • Photovoltaic manufacturing
  • Protective metallic coatings
  • Wafer level metallization and micro-electronics
  • Corrosion/wear and thermal barrier analysis